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Accelerated testing, statistical models, test plans and data analysis

By:

Nelson, Wayne

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Material type: Text

Text

TextSeries: Wiley series in Probability and Mathematical Statistics. Applied Probability and StatisticsPublication details: New York John Wiley 1990Description: xiv, 601p. IndexSubject(s):

DDC classification:

519.5 N432.AT

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Item type	Current library	Call number	Status	Date due	Barcode
Book	ISID	519.5 N432.AT (Browse shelf(Opens below))	Available		DP21870

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