Software reliability, measurement, prediction, application By John D. Musa, Anthony Iannino and Kazuhira Okumoto
Material type:
TextSeries: McGraw-Hill series in Software Engineering & TechnologyPublication details: New York McGraw-Hill 1987Description: xvii, 621p. Index, AppendixSubject(s): DDC classification: - 519.28730285425 M985.SR
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ISID | GR | 519.28730285425 M985.SR (Browse shelf(Opens below)) | Available | G1504 |
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