qrcode

Amazon cover image
Image from Amazon.com

System reliability theory : models, statistical methods, and applications /

By: Contributor(s): Series: Wiley series in probability and statisticsPublication details: Hoboken: John Wiley & Sons, 2020Edition: 3rdDescription: xxx, 813p. Ref. IndexISBN:
  • 9781119373520
DDC classification:
  • 519.2873 R248.SR
Tags from this library: No tags from this library for this title. Log in to add tags.
Star ratings
    Average rating: 0.0 (0 votes)

Library, Indian Statistical Institute, Delhi Centre, 7 S.J.S. Sansanwal Marg, New Delhi - 110 016 (India)
Tel. 91-11 - 4149 3975 / 3976 | Fax. 91-11 - 4149 3981 | Email: library@isid.ac.in