Fu, K. S. and Yu, T. S. <br/><br/>
Statistical pattern classification using contextual information   

 - New York  John Wiley  1980 
 - x, 191p. 
 - Electronic and Electrical Engineering research studies  pattern recognition & image processing series ; v.1 .
<br/><br/>  
<br/><br/><label>Dewey Class. No.: </label>519.134  / F949.SP