00437nam a2200133Ia 4500 251030b |||||||| |||| 00| 0 eng d 519.287 B162.SA Bain, Lee J. 11006 Statistical analysis of reliability and life testing models; theory and methods / New York: Marcel Dekker, 1978 xii, 450p. Index Statistics ; v. 24 11007 ddc BK 0 0 0 519_287000000000000_B162_SA 0 17735 ISI ISI 1998-09-28 0 519.287 B162.SA DP15373 2019-02-14 00:00:00 BK 14512 14512