Nelson, Wayne <br/><br/>
Accelerated testing, statistical models, test plans and data analysis   

 - New York  John Wiley  1990 
 - xiv, 601p. Index 
 - Wiley series in Probability and Mathematical Statistics. Applied Probability and Statistics .
<br/><br/>  
<br/><br/><label>Dewey Class. No.: </label>519.5  / N432.AT