00393nam a2200121Ia 4500082001900000100001800019245007600037260003100113300002100144490009600165500000500261700000500266  a519.5bN432.AT  aNelson, Wayne  aAccelerated testing, statistical models, test plans and data analysisb  aNew YorkbJohn Wileyc1990  axiv, 601p. Index  aWiley series in Probability and Mathematical Statistics. Applied Probability and Statistics  a  a