00604nam a2200181Ia 4500082001900000100001800019245007600037260003100113300002100144490009600165500000500261690000600266700000500272952010100277964001700378921001000395999001700405  a519.5bN432.AT  aNelson, Wayne  aAccelerated testing, statistical models, test plans and data analysisb  aNew YorkbJohn Wileyc1990  axiv, 601p. Index  aWiley series in Probability and Mathematical Statistics. Applied Probability and Statistics  a  a   a  00104070aISIbISId1998-09-28l0o519.5 N432.ATpDP21870r2019-02-14 00:00:00w2019-02-14yBK  abcdefg  a14655  c14655d14655