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  <titleInfo>
    <title>Software reliability, measurement, prediction, application</title>
    <subTitle/>
  </titleInfo>
  <name type="personal">
    <namePart>Musa, John D. and Others</namePart>
    <role>
      <roleTerm authority="marcrelator" type="text">creator</roleTerm>
    </role>
  </name>
  <name type="personal">
    <namePart>Iannino, Anthony ; jt. auth.</namePart>
  </name>
  <name type="personal">
    <namePart>Okumoto, Kazuhira ; jt. auth.</namePart>
  </name>
  <typeOfResource>text</typeOfResource>
  <originInfo>
    <place>
      <placeTerm type="text">New York</placeTerm>
    </place>
    <publisher>McGraw-Hill</publisher>
    <dateIssued>1987</dateIssued>
    <issuance>monographic</issuance>
  </originInfo>
  <physicalDescription>
    <extent>xvii, 621p. Index, Appendix</extent>
  </physicalDescription>
  <note type="statement of responsibility">By John D. Musa, Anthony Iannino and Kazuhira Okumoto</note>
  <note/>
  <classification authority="ddc">519.28730285425 M985.SR</classification>
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