TY  - BOOK
AU  - Musa, John D. and Others
AU  - Iannino, Anthony ; jt. auth.
AU  - Okumoto, Kazuhira ; jt. auth.
TI  - Software reliability, measurement, prediction, application
T2  - McGraw-Hill series in Software Engineering & Technology
U1  - 519.28730285425 
PY  - 1987///
CY  - New York
PB  - McGraw-Hill
ER  -