Hosmer, David W., Jr. and Lemeshow, Stanley <br/><br/>
Applied survival analysis  : regression modeling of time to event data / 

 - New York:  John Wiley,  1999 
 - xiii, 386p. Bibl. Index. 
 - Wiley series in Probability and Statistics .
<br/><br/> "A Wiley Inter-Science Publication" 
<br/><br/><label>ISBN: </label>9780585381930 
<br/><br/><label>Dewey Class. No.: </label>519.5024574  / H827.AS