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Software reliability, measurement, prediction, application By John D. Musa, Anthony Iannino and Kazuhira Okumoto

By: Contributor(s): Material type: TextTextSeries: McGraw-Hill series in Software Engineering & TechnologyPublication details: New York McGraw-Hill 1987Description: xvii, 621p. Index, AppendixSubject(s):
DDC classification:
  • 519.28730285425 M985.SR
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Item type Current library Collection Call number Status Date due Barcode
Book Book ISID GR 519.28730285425 M985.SR (Browse shelf(Opens below)) Available G1504

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