000 00544nam a2200181Ia 4500
082 _a519.134
_bF949.SP
100 _aFu, K. S. and Yu, T. S.
245 _aStatistical pattern classification using contextual information
_b
260 _aNew York
_bJohn Wiley
_c1980
300 _ax, 191p.
490 _aElectronic and Electrical Engineering research studies
_vpattern recognition & image processing series ; v.1
500 _a
690 _a
700 _aYu, T. S. ; jt. auth.
856 _d
_f
964 _a
_b
_c
_d
_e
_f
_g
921 _a12841
999 _c12841
_d12841