000 00491nam a2200169Ia 4500
082 _a519.5
_bN432.AT
100 _aNelson, Wayne
245 _aAccelerated testing, statistical models, test plans and data analysis
_b
260 _aNew York
_bJohn Wiley
_c1990
300 _axiv, 601p. Index
490 _aWiley series in Probability and Mathematical Statistics. Applied Probability and Statistics
500 _a
690 _a
700 _a
964 _a
_b
_c
_d
_e
_f
_g
921 _a14655
999 _c14655
_d14655